Les Ressources
Consulter les dernières références sur la photoémission :
ouvrages, articles, logiciels…
Photographie Université de Limoges – CarMaLim
Ouvrages
Logiciels
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Articles, publications
- S. Guillet, L. Bataillou, O. Kerivel, R. Lazzari
Determination of the intensity/energy response function of a hemispherical photoelectron analyser based on Tougaard background
Journal of Electron Spectroscopy and Related Phenomena, 258, (2023) 147225, DOI:10.1016/j.elspec.2022.147225
- Articles publiés des Journées Nationales des Spectroscopies de PhotoEmission (JNSPE 2022)
Lire les articles scientifiques
EPJ Web of Conferences, Volume 273 (2022), EDP science - Commemorating the Career of David Arthur Shirley
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Journal of Vacuum Science & Technology A - G.H. Major, V. Fernandez, N. Fairley, E.F. Smith, and M.R. Linford
Guide to XPS data analysis: Applying appropriate constraints to synthetic peaks in XPS peak fittingJournal of Vacuum Science & Technology A 40, (6) (2022) 063201
- N. Fairley et coll.
Systematic and Collaborative Approach to Problem Solving using X-ray Photoelectron Spectroscopy
Applied Surface Science Advances, 5, (2021) 100112 - S. Zhu et coll.
HIPPIE: a new platform for ambient-pressure X-ray photoelectron spectroscopy at the MAX IV Laboratory
Journal of Synchrotron Radiation, 28 (2) (2021) pp. 624-636 - Practical guide to the use of backgrounds in quantitative XPS
Journal of Vacuum Science & Technology A 39, 011201 (2021)
- J. Schnadt, J. Knudsen and N. Johansson
Present and new frontiers in materials research by ambient pressure x-ray photoelectron spectroscopy
J. Phys. : Condens. Matter, 32 (2020) 413003 pp. 1-29 - G.H. Major, D. Morgan, V. Fernandez, N. Fairley, M.R. Linford
Advanced Line Shapes in X-Ray Photoelectron Spectroscopy II. A short discussion of Pass Energy in X-Ray photoelectrons Spectroscopy (XPS).
Vacuum Technology & Coating, Vol. 21, N°9 (2020) pp. 31-33 - J. Vac. Sci. Technol. A38 (2020) 061208, DOI : 10.1116/6.0000577p
- V. Fernandez, N. Fairley, J. Baltrusaitis
Applied Surface Science, 2020, 148031, DOI: 10.1016/j.apsusc.2020.148031
- G.H. Major, D. Shah, V. Fernandez, N. Fairley, M.R. Linford
Advanced Line Shapes in X-Ray Photoelectron Spectroscopy I. The Asymetric Lorentzian (LA) Line Shape
Vacuum Technology & Coating, 3 (2020) pp. 43-46 - P. Ondračka, D. Nečas, M. Carette, S. Elisabeth, D. Holec, A. Granier, A. Goullet, L. Zajíčková and M. Richard-Plouet
Unravelling local environments in mixed TiO2–SiO2 thin films by XPS and ab initio calculations
Applied Surface Science, 2020, 145056, DOI: 10.1016/j.apsusc.2019.145056 - G. Greczynski, L. Hutman
X-ray photoelectron spectroscopy : Towards reliable binding energy referencing
Progress in Materials Science 107 (2020) 100591. DOI: 10.1016/j.pmatsci.2019.100591
- A mini review of in situ near-ambient pressure XPS studies on non-noble, late transition metal catalysts
Catal. Sci. Technol., 9 (15) (2019) pp. 3851-3867 - A. Leblanc, N. Mercier, M. Allain, J. Dittmer, T. Pauporte, V. Fernandez, F. Boucher, M. Kepenekian and C. Katan
Enhanced Stability and Bangap Tuning of #-[HC(NH2)2]PbI3 Hybrid Perovskite by Large Cation Integration
ACS Appl. Mater. Interfaces, 2019, 11, 23, pp. 20743-20751, DOI : 10.1021/acsami.9b00210 - Simon R. Bare, Suntharampillai Thevuthasan, C. Richard Brundle, Eds
Applications of XPS in Industry
Special Issue, Journal of Electron Spectroscopy & Related Phenomena - G. Speranza and R. CanteriRxpsG a new open project for Photoelectron and Electron Spectroscopy data processing
SoftwareX, 2019, 10, 100282, DOI : 10.1016/j.softx.2019.100282